Controlled Environments Magazine® E­Newsletter
Contamination Control for Life Sciences and Microelectronics
June 3, 2009 | Volume 3, Issue 22

The Cleanroom Wiper Usage Audit
By Duane Webb
In today’s turbulent economy, even the best run companies are battling dwindling bottom lines and potential reductions in resources. The outlook is no different for critical or cleanroom manufacturing. Cost reduction plans are mandatory and tools must be identified and employed to drive down manufacturing costs while not negatively impacting the process or final product quality. The Cleanroom Wiper Usage Audit is just such a tool.
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PRODUCT FOCUS



Aseptic Apparel

The Kimtech Pure A5 cleanroom apparel features garment design features that make it easier to put on the coveralls without compromising their sterility. The garments were designed for use in the pharmaceutical, biotechnology, and medical device manufacturing industries and other cleanroom settings where sterility is just as important as quality control.
www.kimtech.com

CLEANROOM TIP OF THE WEEK

Causes of Microbial-Induced Corrosion
While microbial-induced corrosion (MIC) does not produce a unique type of corrosion, understanding the dynamics of microbes is a key to avoiding a problem. Microbes thrive under the same conditions as present in many aqueous cleaning systems. They need heat and a food source to provide energy, moisture, and sometimes oxygen.
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MANAGEMENT TIP OF THE WEEK

Five Factors Every Employee Wants From Work
I've developed a mantra of sorts over the years that talks about what people want from work. I've added and subtracted items from the list, and I've explained them in different ways over the years, but fundamentally, people want…
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INDUSTRY NEWS
  • Chinese Researchers Develop Antifogging Nanoparticles
    In a new development that may prevent car windshields and eyeglasses from fogging up, scientists in China are working on raspberry-shaped nanoparticles that will give glass a permanent antifogging coating.
    read more

  • DFEB Methodology Validated for 65-nm Test Chip
    Design-for-e-beam (DFEB) methodology has been validated for low-volume, 65-nm system-on-chip applications, according to a consortium of companies created to develop and promote DFFEB.
    read more

  • Evidence of Macroscopic Quantum Tunneling Detected in Nanowires
    A team of researchers at the University of Illinois has demonstrated that, counter to classical Newtonian mechanics, an entire collection of superconducting electrons in an ultrathin superconducting wire is able to “tunnel” as a pack from a state with a higher electrical current to one with a notably lower current.
    read more

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Industry Calendar

June 8-10, 2009
European Supply Chain and Logistics Summit 2009
Düsseldorf, Germany

June 17-18, 2009
IEST Consumables and Garments Course
Burbank, CA

July 6-8, 2009
American Glovebox Society Annual Conference
San Diego, CA

July 16-17, 2009
Overview of FDA Regulatory Compliance for Medical Devices
Costa Mesa, CA

July 19-23, 2009
SEMICON West
San Francisco, CA

August 24-26, 2009
Active Pharmaceutical Ingredient (API) and Drug Product Specification
Costa Mesa, CA

Aug 30 - Sept 4, 2009
EOS/ESD Symposium
Anaheim, CA

September 2-4, 2009
Technical Writing for the Pharmaceutical, Medical Device, and Biotech Industries
Costa Mesa, CA

September 9-11, 2009
SEMICON Taiwan
Taipei, Taiwan

September 10-11, 2009
Medical Devices: EU Directives, Guidance, CE Marking and ISO Standard Certifications
Malvern, PA

September 14, 2009
PDA/FDA Joint Regulatory Conference
Washington, DC

September 14-15, 2009
Labeling and Labeling Controls in the Medical Devices Industry
Costa Mesa, CA

September 16-17, 2009
INTERPHEX Canada
Toronto, ON, Canada

September 21-23, 2009
LogiPharma 2009
Philadelphia, PA

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