Controlled Environments Magazine® E-Newsletter
Contamination Control for Life Sciences and Microelectronics
February 25, 2009 | Volume 3, Issue 8 Subscribe | Advertising Services | Contact Us

New Research Tool for Engineers
A team of Carnegie Mellon University engineers led by Levent Burak Kara and Kenji Shimada have developed software that will let engineers design new products by simply sketching their ideas on a tablet computer.
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CLEANROOM TIP OF THE WEEK
Reducing Surface Contamination on Wafers
The surface contamination of wafers, especially by particle contaminants, has been one of the major problems in the semiconductor industry since its inception. The yield on fully processed silicon wafers is inversely related to the defect density of the wafers.
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Invisible image for layout purposes
MANAGEMENT TIP OF THE WEEK
Why we procrastinate and how to stop
It's a new year and many of us have started thinking about various resolutions: updating that resume, cleaning out the attic, starting that exercise routine.
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PRODUCT FOCUS
AEROTRAK™ Handheld Particle Counter
The AEROTRAK™ 9306 Handheld Particle Counter offers features and flexibility for customers interested in versatile handheld particle contamination monitoring. The integrated 3.7-inch color touch screen interface allows the instrument to configure, operate, and report up to 6 particle sizes simultaneously along with environmental data. The internal memory can store up to 10,000 sample records. (TSI)
INDUSTRY NEWS
IN THE MAGAZINE

Cover of Controlled Environments MagazineRegulatory Forum: Harmonization Challenges In Designing An Ex-U.S. Manufacturing Facility
Dry ice blasting can be used to clean equipment while the equipment is hot and assembled, thereby eliminating prolonged production shutdown times.
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INDUSTRY CALENDAR
March 17-19, 2009
INTERPHEX 2009
New York, NY

March 17-19, 2009
SEMICON China
Shanghai, China

March 19-20, 2009
Enhancing Your Cleanroom Operations for Managers, Operators, Maintenance Personnel
Utica, NY

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