Suspect Counterfeit Detection, Avoidance and Mitigation
The University of Oxford presents a unique new course 18-19 November 2010:
Are you or your supply chain properly handling Class 0 ESD sensitive devices with validated packaging during the parts inspection process?
This 2-day course is in an interactive case study format and will review not only non-conformance related issues, but also validation methods often overlooked in a Suspect Counterfeit Countermeasure Program.
The course provides in-depth technical review of validation issues:
✓ Where do counterfeits come from?
✓ How can counterfeits be identified?
✓ How can counterfeiting be combated?
✓ Are proper ESD measures being employed?
✓ Does your inspection process compromise Class 0 ESD sensitive devices?
✓ How are parts coded, tracked and safeguarded by employing RFID?
Issues:
✓ Supplier Non-Conformance
✓ Long Term Storage Issues
✓ Outdated Standards
✓ Lack of Class 0 Device Training
✓ Incoming Inspection Practices
✓ Inadequate Inspection of
✓ Sensitive Components
✓ Packaging Inspection?
✓ Validation beyond Parts!
✓ Physical Audits of Packaging Materials – Not Just Processes!
✓ Leadership from the Top Down!
Who is this course for?
Engineers & quality assurance, procurement engineering and supply chain management professionals who utilize or purchase components from systems integrators, manufacturers and distributors.
Industry Sectors for Application:
Aerospace & Defense, Semiconductor, Medical Device, Disk Drive, Automotive and Telecommunications
Course presenters
Bob Vermillion, RMV Technology Group, LLC at NASA-Ames Research Center (ARC).
Douglas Smith, Author of High Frequency Measurements and Noise in Electronic Circuits
Further Information
Website: - http://cpd.conted.ox.ac.uk/electronics/courses/counterfeit_detection.asp
Email: technology@conted.ox.ac.uk

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