We’ve all been there. A team member comes up to you with a “great idea.” Sometimes the idea is good, but maybe not great. Sometimes the idea has little merit. In his blog, “Radical Management,” Steve Denning offers advice on how to respond in these situations without deflating the energies and passion of your team.
Planning and pre-testing are keys to successful validation. Validation of a critical or precision cleaning process is a good idea whether or not there are specific regulatory requirements to do so. A validated cleaning and contamination control process is important in placing you above the competition.
In the disc drive, microelectronics, and semiconductor industries, static electricity can cause immediate or latent failure of the product. It is imperative to control static electricity in cleanrooms and controlled environments.
All you have to do is look around your organization to see the impact this economic storm has had on the workplace. Now it’s time to focus on the process of rebuilding loyalty and employee engagement.
The suggestion is often heard in troubleshooting or, proactively, in validating critical cleaning processes.
Current industry activity is strong in production of enclosed cleaning machines which allow cleaning solvents to be used under vacuum conditions.
Is it appropriate to test an ESD garment on an operator?
What’s the most efficient and cost-effective way for a growing company to deal with airborne molecular contamination (AMC) through the life cycle of a manufacturing facility?
Nanoscale research involves measurement, manipulation, and fabrication on a minuscule scale. The accurate tasks essential to nanoscale research require “quiet” spaces.
If you’re planning a new cleanroom, or maintaining an existing one, your choice of filters can be critical to product quality, production yields, and regulatory compliances.
How would you like to start up a facility with no major problems or last minute changes in design or implementation?
Airborne Molecular Contamination Monitoring: Optimization Strategies to Ensure Environmental ControlAugust 22, 2011 2:13 pm | by Dan Rodier, Ph.D. | Particle Measuring Systems | Comments
Yield losses due to airborne molecular contamination (AMC) issues started to emerge in semiconductor manufacturing over 20 years ago.
Regarding the article in the June issue there is another, often forgotten, aspect of the monitoring program, which is the witness plate sampling and counting method as described in IEST-STD-CC1246D.
Purge with gas ionized by an inline electrical ionizer can effectively neutralize charges on wafers in a FOUP, reducing the chance of ESD occurrence.